Jasco FT/IR-4200 was designed to provide operational features and
sensitivity levels found only in more expensive instruments. The
innovative technology incorporated in this instrument results in
exceptionally high signal-to-noise ratio specifications.The model
offers exceptional flexibility and can be easily upgraded to meet new
requirements. Optional expandability includes microanalysis with an IR
microscope, IR imaging with a multichannel microscope, and rapid scan
option. The Jasco Quick Start System enables users of all experience
levels to measure samples and perform data processing functions quickly
and easily with a simple push of a button.
The FT/IR-4200 offers excellent resolution and sensitivity levels to accommodate a variety of complex IR demands. It is suitable for research, development, and quality control applications where high levels of accuracy and precision are required. The FT/IR-4200 can be used for the measurement of both solid and gaseous samples.
Robust, High Sensitivity FT-IR Systems for Education and Routine Analysis
Higher Signal-to-Noise Ratio than Competitive Systems
Easy, Single Step Analysis and Data Processing
IR Imaging with Multichannel Microscope and Rapid Scan Option