Echelle

A diffraction grating designed to operate with incident and diffracted light at an angle greater than 45° from the grating normal.



The term "Echelle" was found in the following pages:

Instrument database: Analytik Jena AG - contrAA 700 - High-Resolution Continuum Source Atomic Absorption Spectrometer
Instrument database: PerkinElmer Inc. - AAnalyst 400
Instrument database: Varian Inc. - Vista-PRO Simultaneous ICP-OES
Instrument database: Thermo Scientific - IRIS Intrepid II
Instrument database: Marwan Technology s.r.l. - Modě - Double - pulse Laser Induced Breakdown Spectrometer
Instrument database: Analytik Jena AG - contrAA 600 – High-resolution continuum source AAS for the graphite furnace technique
Instrument database: Varian Inc. (Part A) - Vista-PRO Simultaneous ICP-OES
Instrument database: Thermo Scientific - SOLAAR M Series AA Spectrometer
Instrument database: Shimadzu Europe - ICPE-9000
Instrument database: LLA Instruments GmbH - LIPAN 3002 Laser Plasma Analyzer – Modular System (OEM-Version)
Instrument database: Perkin-Elmer Corp. - Optima 3000
Instrument database: Thermo Scientific - iCAP 6200 dual-view ICP emission spectrometer
Instrument database: Agilent Technologies Inc. - 710 Series ICP-OES instruments
Instrument database: PerkinElmer Inc. - SIMAA 6100
Instrument database: Applied Research Laboratories (ARL) - MAXIM - Simultaneous ICP-OES Spectrometer
Instrument database: Varian Inc. - Vista MPX Simultaneous ICP-OES
Instrument database: PerkinElmer Inc. - Optima 2000 DV
Instrument database: Thermo Jarrel-Ash - Quadrion (POEMS)
Instrument database: PerkinElmer Inc. - Optima 4300 DV ICP-OES
Instrument database: Varian Inc. (Part A) - Vista MPX Simultaneous ICP-OES