PIXE

Particle-Induced X-ray Emission Analysis (PIXE) is an analytical technique based on the creation of inner-shell vacancies in the atoms of the specimen by the bombardement with heavy charged particles (i.e. protons, alpha-particles, or heavy ions).



The term "PIXE" was found in the following pages:

Colloquium Spectroscopicum Internationale XXXIV | EVISA's Agenda of Events
CSI 2015: Colloquium Spectroscopicum Internationale | EVISA's Agenda of Events
Cancelled: ESAS 2020: European Symposium on Atomic Spectrometry | EVISA's Agenda of Events
CSI 2013: XXXVIII Colloquium Spectroscopicum Internationale | EVISA's Agenda of Events
CSI XL: Colloquium Spectroscopicum Internationale XL | EVISA's Agenda of Events
Company database: Elemental Analysis Inc.
CSI 2012: XXXVIII Colloquium Spectroscopicum Internationale | EVISA's Agenda of Events
CSI XL: Colloquium Spectroscopicum Internationale XL | EVISA's Agenda of Events
Colloquium Spectroscopicum Internationale (CSI XXXVI) | EVISA's Agenda of Events
ESAS 2014: European Symposium on Atomic Spectrometry / 15th Czech -Slovak Spectroscopic Conference | EVISA's Agenda of Events
Link database: Portugal:Elemental Characterization and Speciation using Ion Beams (CEEFI) Group
Journals database: International Journal of PIXE
CSI XXXVII: Colloquium Spectroscopicum Internationale XXXVII | EVISA's Agenda of Events
ESAS-CSSC: European Symposium on Analytical Spectrometry 2022 /17th Czech-Slovak Spectroscopic Conference | EVISA's Agenda of Events
ESAS 2020: European Symposium on Atomic Spectrometry | EVISA's Agenda of Events
ISTERH 2015: Recent Advances in Trace Element Research in Health and Disease | EVISA's Agenda of Events
CSI 2012: XXXVIII Colloqium Spectroscopicum Internationale | EVISA's Agenda of Events