The JSM-6490LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless obervation and EDS anaylsis.
The JSM-6490LA has a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter. Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.
Other features include:
Fast, unattended data acquisition
Smart settings for common samples
Customized toolbars for repetitive functions
Enhanced SE imaging
Super conical lens
Fully automatic vacuum system
Large specimen chamber
LV secondary electron detector
New features include:
Improved low kV imaging in both high and low vacuum
Multiple live image display (including picture in picture)