High speed rate (1000°/min) and high precision angle reproducibility (±0.001°) provide fast measurement and highly reliable data. The goniometer is essentially composed of two precision gear-wheels, supported by high precision ball races. Each wheel is coupled to an anodised aluminium disk, upon which are turned some grooves for easy mounting of accessories. Easy to handle: compact dimensions permit vertical and horizontal mounting by utilising a suitable optical stand. The X-ray beam collimation is obtained by a series of fixed but interchangeable bayonet-joint slits that guarantee a perfect alignment of the beam in the horizontal direction, while in the vertical direction the divergence is limited by Soller slits. The bracket of the incident beam slits, is mounted on the X-ray tube shield; this greatly facilitates the alignment, that is already simplified by the micrometric movements of the horizontal and vertical stand, about X-Y-Z axis.
Multi-purpose X-ray diffractometer
Ultra stable X-ray generator with an on-board microprocessor controlled via a PC serial port
Tube shield with a tube that can be rotated to allow the use of the point or the line focus
Focusing Ka1 monochromators for high intensity and resolution
Parallel-beam optics using a Max-FluxTM Optical System
Possibility of changing automatically from transmission to reflection mode
High precision, high speed goniometer
Secondary monochromator suitable for Ag, Cr, Fe, Cu, Co and Mo radiations
Xenon gas filled proportional, scintillation, linear and curved position-sensitive detectors
Non-ambient analysis, low and high temperature attachments
Microsoft’s Windows 98/NT/2000/ME operating system in a 32-bit environment for data processing and instrument control
Crystallographic software including Rietveld’s refinement
The latest multi-functional diffraction system developed by Ital Structures
Data accuracy, simplicity of use and great versatility are the main features of this multi-functional system.
The APD 2000 digital powder diffraction system incorporates the most advanced digital electronics, computers and Microsoft’s Windows 98/NT/2000/ME operating system.
The APD 2000 diffractometer can be equipped with various attachments for your special field of research. In addition, custom-designed accessories can be manufactured to your specifications.
Great attention has been given to operator safety: a series of devices are used to prevent accidental danger from irradiation and an X-ray proof cabin covers the working table.
The APD 2000 offers solutions for a wide range of analytical requirements, from routine qualitative and quantitative analysis, to residual-stress analysis, thin films, texture, non-ambient analyses, retained austenite quantification, crystallite size/lattice strain and crystallinity calculations.
Fields of application include: environment, soil/rocks, clay, minerals, ceramics, cement, glass, petroleum, catalysts, polymers, agricultural science, biosciences, chemicals, pharmaceuticals, cosmetics, paints, nuclear, steels, textiles, electronic and magnetic materials.
X-ray generator (PC-Controlled) Maximum output power: 3 kW Output stability: <0.01% (for 10% power supply fluctuation) Max. output voltage: 60 kW Max. output current: 60 mA Voltage step width: 0.1 kV Current step width: 0.1 mA PC control serial mode: X-ray ON/OFF, settings of kV and mA, shutters Safety devices: Door interlock mechaninsm, emergency push button X-ray ON lamp Weight: 45 kg Size: Width 48.3 cm, height 22 cm, depth 63 cm
X-ray tube Type: Glass, Cu anode, fine focus Focus: 0.4 x 8 mm Max. output: 1.5 kW
Processing Unit Computer type: Personal computer, the latest version Items controlled: X-ray generator, goniometer, detector, counting chain Basic data processing: Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Four data buffers available. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples.